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ISO 17915:2018

Optics and photonics - Measurement method of semiconductor lasers for sensing
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ISO 17915:2018

Optics and photonics - Measurement method of semiconductor lasers for sensing

PUBLISH DATE 2018
ISO 17915:2018

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.

This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

SDO ISO: International Organization for Standardization
Document Number ISO 17915
Publication Date May 1, 2018
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 172/SC 9
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