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ISO 21222:2020

Surface chemical analysis - Scanning probe microscopy - Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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ISO 21222:2020

Surface chemical analysis - Scanning probe microscopy - Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

PUBLISH DATE 2020
ISO 21222:2020

This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM).

Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory.

This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa.

The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately 10-20 nm.

SDO ISO: International Organization for Standardization
Document Number ISO 21222
Publication Date Jan. 1, 2020
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 201/SC 9
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