Logo
Login Sign Up
Current Revision

ISO 22493:2014

Microbeam analysis - Scanning electron microscopy - Vocabulary
Best Price Guarantee
Instant

$170.94

2-5 Days

$170.94

SAVE 15%

$290.60


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
International Organization for Standardization Logo

ISO 22493:2014

Microbeam analysis - Scanning electron microscopy - Vocabulary

PUBLISH DATE 2014
ISO 22493:2014

ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.

ISO 22493:2014 is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g., EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

SDO ISO: International Organization for Standardization
Document Number ISO 22493
Publication Date April 15, 2014
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 202/SC 1
Loading...

Failed to load document history.

Publish Date Document Id Type View