Logo
Login Sign Up
Current Revision

ISO 6342:2003

Micrographics - Aperture cards - Method of measuring thickness of buildup area
Best Price Guarantee
Instant

$55.44

2-5 Days

$55.44

SAVE 15%

$94.25


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
International Organization for Standardization Logo

ISO 6342:2003

Micrographics - Aperture cards - Method of measuring thickness of buildup area

PUBLISH DATE 2003
ISO 6342:2003

ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.

SDO ISO: International Organization for Standardization
Document Number ISO 6342
Publication Date July 1, 2003
Language en - English
Page Count
Revision Level
Supercedes
Committee ISO/TC 171/SC 2
Loading...

Failed to load document history.

Publish Date Document Id Type View