JEDEC JESD47M

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Stress-Test-Driven Qualification of Integrated Circuits

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Stress-Test-Driven Qualification of Integrated Circuits

PUBLISH DATE 2025
This standard describes a baseline set of acceptance tests for use in qualifying electronic devices as new products, a product family, or as products in a process which is being changed. A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office.
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