JIS R 1637:1998

Current Revision
Test method for resistivity of conductive fine ceramic thin films with a four-point probe array

Best Price Guarantee English 1 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00
View in Library
or
Japanese Industrial Standards Logo

Test method for resistivity of conductive fine ceramic thin films with a four-point probe array

No overview provided by publisher

Loading...

Failed to load document history.

Publish Date Document Id Type View