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A collection of featured documents from our library that are popular among our users or otherwise noteworthy.
Use of Semiconductor Devices Outside Manufacturers' Specified Temperature Ranges
32 Bit Binary CL (BCL) and 7 Bit ASCII CL (ACL) Exchange Input Format for Numerically Controlled Machines
Manufacturing Message Specification – Service Definition and Protocol
Electronic Design Interchange Format Version 200
Method Selection for Assessment of Nonconforming Levels in Parts Per Million (PPM)
Lot Acceptance Procedure for Verifying Compliance With the Specified Quality Levels (SQL) in PPM
Zero Acceptance Number Sampling Procedures and Tables for Inspection by Attributes of A Continuous Manufacturing Process
Zero Acceptance Number Sampling Procedures and Tables for Inspection by Attributes of Isolated Lots
Assessment of Quality Levels in PPM Using Variables Test Data
National Electronic Process Certification Standard
General Procedure for Capability Approval of Electronic Components
Processes for Engineering a System
Configuration Management Acquisition Requirements for Aeronautics and Space
Assessment Guide for Process Certification
Guideline on the Use and Application of Cpk
Earned Value Management Systems
International and National Quality Standards Index
Model for Integrating Metrics into the Procurement Process
Process Improvement Guidelines
Configuration Management Data Exchange and Interoperability
Requirements for a COTS Assembly Management Plan
Automation Bulletin No. 3
Harmonizing CALS Product Data Description Standards
Introduction to EDIF, Volume 1
EDIF Connectivity, Volume 2