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Historical Revision

ASTM E2444-05

Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films (Withdrawn 2026)
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1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

SDO ASTM: ASTM International
Document Number E2444
Publication Date May 1, 2005
Language en - English
Page Count 3
Revision Level 05
Supercedes
Committee E08.05
Publish Date Document Id Type View
May 1, 2018 E2444-11R18 Revision
Oct. 15, 2011 E2444-11E01 Revision
Oct. 15, 2011 E2444-11 Revision
May 1, 2005 E2444-05E01 Revision
May 1, 2005 E2444-05 Revision