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BSI BS 6493-3:1985

Semiconductor devices -- Mechanical and climatic test methods
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BSI BS 6493-3:1985

Semiconductor devices -- Mechanical and climatic test methods

PUBLISH DATE 1986
BSI BS 6493-3:1985
PART 3: MECHANICAL and CLIMATIC
Special requirements for test methods additional to IEC 60068, and certain specific and complete test methods.
SDO BSI: British Standards Institution
Document Number 6493-3
Publication Date Jan. 31, 1986
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
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