BSI BS 6493-3:1985

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Semiconductor devices -- Mechanical and climatic test methods

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A newer publication replaces it: BSI BS EN 60749


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BSI BS 6493-3:1985

Semiconductor devices -- Mechanical and climatic test methods

PUBLISH DATE 1986
BSI BS 6493-3:1985

PART 3: MECHANICAL and CLIMATIC

Special requirements for test methods additional to IEC 60068, and certain specific and complete test methods.

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