BSI BS EN 60749-31:2003

Current Revision
Semiconductor devices. Mechanical and climatic test methods -- Flammability of plastic-encapsulated devices (internally induced)

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BSI BS EN 60749-31:2003

Semiconductor devices. Mechanical and climatic test methods -- Flammability of plastic-encapsulated devices (internally induced)

PUBLISH DATE 2003
PAGES 8
BSI BS EN 60749-31:2003

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.

The contents of the corrigendum of August 2003 have been included in this copy.

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