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BSI BS IEC 62951-3:2018

Semiconductor devices. Flexible and stretchable semiconductor devices -- Evaluation of thin film transistor characteristics on flexible substrates under bulging
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BSI BS IEC 62951-3:2018

Semiconductor devices. Flexible and stretchable semiconductor devices -- Evaluation of thin film transistor characteristics on flexible substrates under bulging

PUBLISH DATE 2018
PAGES 24
BSI BS IEC 62951-3:2018
IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.
SDO BSI: British Standards Institution
Document Number IEC 62951-3
Publication Date Nov. 15, 2018
Language en - English
Page Count 24
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
Nov. 15, 2018 BS IEC 62951-3:2018 Revision