Logo
Login Sign Up
Current Revision

IEC 62951-3 Ed. 1.0 en:2018

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
Best Price Guarantee

$262.00

2-5 Days

$262.00

SAVE 10%

$471.60


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


or
International Electrotechnical Commission Logo

IEC 62951-3 Ed. 1.0 en:2018

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

PUBLISH DATE 2018
PAGES 26
IEC 62951-3 Ed. 1.0 en:2018
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.
SDO IEC: International Electrotechnical Commission
Document Number IEC 62951
Publication Date Nov. 1, 2018
Language en - English
Page Count 26
Revision Level 1.0
Supercedes
Committee 47
Publish Date Document Id Type View
Nov. 1, 2018 Revision
Nov. 1, 2018 IEC 62951-3 Ed. 1.0 en:2018 Revision