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BSI BS ISO 24173:2009

Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
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BSI BS ISO 24173:2009

Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

PUBLISH DATE 2009
PAGES 54
BSI BS ISO 24173:2009

This International Standard gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

SDO BSI: British Standards Institution
Document Number ISO 24173
Publication Date Oct. 31, 2009
Language en - English
Page Count 54
Revision Level
Supercedes
Committee CII/9
Publish Date Document Id Type View
Feb. 19, 2024 BS ISO 24173:2024 Revision
Oct. 31, 2009 BS ISO 24173:2009 Revision