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ESDA ANSI/ESDA/JEDEC JS-002-2025

ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing – Charged Device Model (CDM) – Device Level
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ESDA ANSI/ESDA/JEDEC JS-002-2025

ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing – Charged Device Model (CDM) – Device Level

ESDA ANSI/ESDA/JEDEC JS-002-2025
This document establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin-film circuits, surface acoustic wave (SAW) devices, optoelectronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this standard. The devices shall be assembled into a package similar to that expected in the final application to perform the tests. This CDM document does not apply to socketed discharge model testers.
SDO ESDA: Electrostatic Discharge Association
Document Number JS-002
Publication Date Not Available
Language en - English
Page Count
Revision Level
Supercedes
Committee
Publish Date Document Id Type View
Not Available ANSI/ESDA/JEDEC JS-002-2025 Revision
Jan. 1, 2022 Revision