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Historical Revision

IEC 60931-2 Ed. 2.0 b:1995

Shunt power capacitors of the non-self-healing type for AC systems having a rated voltage up to and including 1 000 V - Part 2: Ageing test and destruction test
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IEC 60931-2 Ed. 2.0 b:1995

Shunt power capacitors of the non-self-healing type for AC systems having a rated voltage up to and including 1 000 V - Part 2: Ageing test and destruction test

PUBLISH DATE 1995
IEC 60931-2 Ed. 2.0 b:1995
Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including 1000 V - Part 2: Ageing test and destruction test
Applies to capacitors according to IEC 60931-1 and gives the requirements for the ageing test and destruction test for these capacitors. The two ageing test methods are intended to ensure that the capacitor case temperature is maintained constant during the test. The destruction test is performed to evaluate the behaviour of the capacitor at the end of its life.
SDO IEC: International Electrotechnical Commission
Document Number IEC 60931
Publication Date Dec. 1, 1995
Language b - English & French
Page Count
Revision Level 2.0
Supercedes
Committee 33
Publish Date Document Id Type View
Not Available IEC 60931-2 Ed. 3.0 b:2025 Revision
June 5, 2024 Revision
Dec. 1, 1995 IEC 60931-2 Ed. 2.0 b:1995 Revision