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IEC 62884-2 Ed. 1.0 en:2017

Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 2: Phase jitter measurement method
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IEC 62884-2 Ed. 1.0 en:2017

Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 2: Phase jitter measurement method

PUBLISH DATE 2017
PAGES 28
IEC 62884-2 Ed. 1.0 en:2017
Measurement techniques of piezoelectric, dieletric and electrostatic oscillators - Part 2: Phase jitter measurement method
IEC 62884-2:2017(E) specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.

SDO IEC: International Electrotechnical Commission
Document Number IEC 62884
Publication Date Aug. 1, 2017
Language en - English
Page Count 28
Revision Level 1.0
Supercedes
Committee 49
Publish Date Document Id Type View
Aug. 1, 2017 IEC 62884-2 Ed. 1.0 en:2017 Revision
Aug. 1, 2017 Revision
June 5, 2024 Revision
Not Available IEC 62884-2 Ed. 1.0 b:2017 Revision