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IEC 62884-3 Ed. 1.0 b:2018

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
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IEC 62884-3 Ed. 1.0 b:2018

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods

IEC 62884-3 Ed. 1.0 b:2018
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
IEC 62884-3:2018 describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions.
This document was developed from the works related to IEC 60679-1:2007 (third edition), the measurement techniques of which were restructured into different parts under a new project reference. This document describes the measurement method for frequency aging only.
SDO IEC: International Electrotechnical Commission
Document Number IEC 62884
Publication Date Not Available
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 49
Publish Date Document Id Type View
March 1, 2018 Revision
March 1, 2018 IEC 62884-3 Ed. 1.0 en:2018 Revision
June 5, 2024 Revision
Not Available IEC 62884-3 Ed. 1.0 b:2018 Revision