Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence

Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 5: Test method for defects using X-ray topography

Dedicated radionuclide imaging devices - Characteristics and test conditions - Part 1: Cardiac SPECT

Superconducting AC power cables and their accessories for rated voltages from 6 kV to 500 kV - Test methods and requirements

Railway applications - Rolling stock - Electrical equipment in trolley buses - Safety requirements and current collection systems

Installations for electroheating and electromagnetic processing - Test methods for induction through-heating installations

Accessibility terms and definitions

Intelligent device management - Part 1: Concepts and terminology

Intelligent device management – Part 2: Requirements and recommendations

Radiation protection instrumentation - System of spectral identification of liquids in transparent and semitransparent containers (Raman systems)

Household and similar electrical air cleaning appliances - Methods for measuring the performance - Part 1: General requirements

Household and similar electrical air cleaning appliances - Methods for measuring the performance - Part 2-1: Particular requirements for determination of reduction of particles

Household and similar electrical air cleaning appliances - Method for measuring the performance - Part 2-2: Particular requirements for determination of gas-phase pollutant reduction

Assistive listening devices and systems for active assisted living

Assistive listening devices and systems for active assisted living - Part 1: General

Photovoltaics in buildings - Part 1: Requirements for building-integrated photovoltaic modules

Photovoltaics in buildings - Part 2: Requirements for building-integrated photovoltaic systems

Ferrite cores - Guidelines on dimensions and the limits of surface irregularities - Part 10: PM-cores and associated parts

Ferrite cores - Guidelines on dimensions and the limits of surface irregularities - Part 11: EC-cores for use in power supply applications

Ferrite cores - Guidelines on dimensions and the limits of surface irregularities - Part 12: Ring-cores

Ferrite cores - Guidelines on dimensions and the limits of surface irregularities - Part 13: PQ-cores

Ferrite cores - Guidelines on dimensions and the limits of surface irregularities - Part 14: EFD-cores

Ferrite cores - Guidelines on dimensions and the limits of surface irregularities - Part 15: U-cores

Ferrite cores - Guidelines on dimensions and the limits of surface irregularities - Part 2: Pot-cores for use in telecommunications, power supply, and filter applications

Ferrite cores - Guidelines on dimensions and the limits of surface irregularities - Part 3: Half pot-cores made of ferrite for inductive proximity switches