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BSI BS EN 60749-10:2002

Semiconductor devices. Mechanical and climatic test methods -- Mechanical shock
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BSI BS EN 60749-10:2002

Semiconductor devices. Mechanical and climatic test methods -- Mechanical shock

PUBLISH DATE 2002
PAGES 8
BSI BS EN 60749-10:2002
Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.
SDO BSI: British Standards Institution
Document Number EN 60749-10
Publication Date Sept. 17, 2002
Language en - English
Page Count 8
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
Aug. 28, 2002 BS EN 60749-10:2002 Revision
Sept. 17, 2002 BS EN 60749-10:2002 Consolidated