BSI BS EN 60749-5:2017

Current Revision
Semiconductor devices. Mechanical and climatic test methods -- Steady-state temperature humidity bias life test

Best Price Guarantee Jul 20, 2017 English 16 Pages

This Document Has Been Superseded

A newer publication replaces it: BSI BS EN 60335-2-9, BSI BS EN IEC 60749-5


Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00

You own the digital copy of this edition

View in Library
or
British Standards Institution Logo

BSI BS EN 60749-5:2017

Semiconductor devices. Mechanical and climatic test methods -- Steady-state temperature humidity bias life test

PUBLISH DATE 2017
PAGES 16
BSI BS EN 60749-5:2017

This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

This test method is considered destructive.

Loading...

Failed to load document history.

Publish Date Document Id Type View