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BSI BS EN 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
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BSI BS EN 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

PUBLISH DATE 2006
PAGES 16
BSI BS EN 62373:2006
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
SDO BSI: British Standards Institution
Document Number EN 62373
Publication Date Sept. 29, 2006
Language en - English
Page Count 16
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
Sept. 29, 2006 BS EN 62373:2006 Revision