IEC 62373 Ed. 1.0 b:2006

Current Revision
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

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Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

PUBLISH DATE 2006
PAGES 36

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).

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