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IEC 62373 Ed. 1.0 b:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
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IEC 62373 Ed. 1.0 b:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

PUBLISH DATE 2006
PAGES 36
IEC 62373 Ed. 1.0 b:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
SDO IEC: International Electrotechnical Commission
Document Number IEC 62373
Publication Date July 1, 2006
Language b - English & French
Page Count 36
Revision Level 1.0
Supercedes
Committee 47
Publish Date Document Id Type View
July 1, 2006 Revision
July 1, 2006 IEC 62373 Ed. 1.0 b:2006 Revision