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BSI BS IEC 63003:2015

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505<sup>TM</sup>

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BSI BS IEC 63003:2015

Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505<sup>TM</sup>

PUBLISH DATE 2016

PAGES 174

Document Information

The scope of this standard is the definition of a pin map utilizing the IEEE 1505^{™ 1} receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.


SDO	BSI: British Standards Institution
Document Number	IEC 63003
Publication Date	Jan. 31, 2016
Language	en - English
Page Count	174
Revision Level
Supercedes
Committee	EPL/501

Publish Date	Document Id	Type	View
Jan. 31, 2016	BS IEC 63003:2015	Revision

SDO	Document	Title
IEEE	IEEE 1505.1	IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
IEC	IEC 63003	Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
IEEE	IEEE/IEC 63003	IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
IEEE	IEEE 1505.3	IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard
IEEE	IEEE 1450.2	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification
IEEE	IEEE 1450.3	IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
IEEE	IEEE 1505	IEEE Standard for Receiver Fixture Interface
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