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IEC 60512-26-100 Ed. 1.0 b:2008

Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g
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IEC 60512-26-100 Ed. 1.0 b:2008

Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g

PUBLISH DATE 2008
PAGES 118
IEC 60512-26-100 Ed. 1.0 b:2008
Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g
IEC 60512-26-100:2008 specifies the test and measurements and the related measurement setup and reference arrangements for interoperability and backward compatibility tests for the development and qualification of 8-way, free and fixed connectors for data transmission. The following test methods are provided: insertion loss, test 26a; return loss, test 26b; near-end crosstalk (NEXT), test 26c; far-end crosstalk (FEXT), test 26d; transfer impedance, test 26e; transverse conversion loss (TCL), test 26f; transverse conversion transfer loss (TCTL), test 26g.
SDO IEC: International Electrotechnical Commission
Document Number IEC 60512
Publication Date July 1, 2008
Language b - English & French
Page Count 118
Revision Level 1.0
Supercedes
Committee 48B
Publish Date Document Id Type View
May 1, 2011 IEC 60512-26-100 Ed. 1.1 b:2011 Revision
May 1, 2011 Revision
July 1, 2008 IEC 60512-26-100 Ed. 1.0 b:2008 Revision
July 1, 2008 Revision