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IEC 62899-402-1 Ed. 2.0 en:2025

Printed electronics - Part 402-1: Printability - Measurement of qualities - Line pattern widths
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IEC 62899-402-1 Ed. 2.0 en:2025

Printed electronics - Part 402-1: Printability - Measurement of qualities - Line pattern widths

IEC 62899-402-1 Ed. 2.0 en:2025
IEC 62899-402-1:2025 specifies the measurement methods of the width of line pattern and spaces between the line patterns in printed electronics. These printed line patterns are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for vertical variance in printed electronics.
This edition includes the following significant technical changes with respect to the previous edition:
a) The title is changed from 'Printability – Measurement of qualities – Pattern width' to 'Printability – Measurement of qualities – Line pattern width'
b) The term 'pattern width' is specified as 'line pattern width'.
c) The measurement method of line pattern space is included.
d) The definition and measurement of inner/outer edge lines are removed.
SDO IEC: International Electrotechnical Commission
Document Number IEC 62899
Publication Date Not Available
Language en - English
Page Count
Revision Level 2.0
Supercedes
Committee 119
Publish Date Document Id Type View
Not Available IEC 62899-402-1 Ed. 2.0 en:2025 Revision
March 1, 2017 Revision
March 1, 2017 IEC 62899-402-1 Ed. 1.0 en:2017 Revision