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IEC 63616 Ed. 1.0 en:2025

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method
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IEC 63616 Ed. 1.0 en:2025

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method

IEC 63616 Ed. 1.0 en:2025
IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.
SDO IEC: International Electrotechnical Commission
Document Number IEC 63616
Publication Date Not Available
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 46F
Publish Date Document Id Type View
Not Available IEC 63616 Ed. 1.0 en:2025 Revision
Not Available IEC 63616 Ed. 1.0 b:2025 Revision