EMC IC modelling - Part 1: General modelling framework

EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)

EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)

EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)

EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI)

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data

Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices

Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or finished devices

Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices

Electronic components – Long-term storage of electronic semiconductor devices – Part 8: Passive electronic devices

Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special cases

Radiation protection instrumentation - Mobile instrumentation for the measurement of photon and neutron radiation in the environment

Industrial communication networks - High availability automation networks - Part 1: General concepts and calculation methods

Industrial communication networks - High availability automation networks - Part 2: Media Redundancy Protocol (MRP)

Industrial communication networks - High availability automation networks - Part 4: Cross-network Redundancy Protocol (CRP)

Industrial communication networks - High availability automation networks - Part 6: Distributed Redundancy Protocol (DRP)

Industrial communication networks - High availability automation networks - Part 7: Ring-based Redundancy Protocol (RRP)

Electric cables with a rated voltage not exceeding 450/750 V - Guide to use

Energy performance of lamp controlgear - Part 1: Controlgear for fluorescent lamps - Method of measurement to determine the total input power of controlgear circuits and the efficiency of controlgear

Energy performance of lamp controlgear - Part 2: Controlgear for discharge lamps (excluding low-pressure mercury fluorescent lamps) - Method of measurement to determine the efficiency of controlgear

Energy performance of lamp controlgear - Part 3: Controlgear for tungsten-halogen lamps and LED light sources - Method of measurement to determine the efficiency of controlgear

Cable glands for electrical installations

Photovoltaic (PV) systems - Requirements for testing, documentation and maintenance - Part 2: Grid connected systems - Maintenance of PV systems

Helical-scan compressed digital video cassette system using 6,35 mm magnetic tape - Format D-12 - Part 1: VTR specifications