A collection of featured documents from our library that are popular among our users or otherwise noteworthy.
Maritime navigation and radiocommunication equipment and systems - Maritime survivor locating devices (man overboard devices) - Minimum requirements, methods of testing and required test results
Predictive maintenance of industrial automation equipment and systems - Part 1: General requirements
Nuclear facilities - Electrical power systems - AC interruptible power supply systems
Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability
Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation due to body diode operation
Binary power generation systems with capacity less than 100 kW - Performance test methods
Binary power generation systems - Part 3-1: Safety requirements - System with less than 500 kW in capacity
Asset Administration Shell for industrial applications - Part 1: Asset Administration Shell structure
E-Transporters - Part 1: Terminology and classification
E-Transporters - Part 2-1: Safety requirements and test methods for personal e-Transporters
E-Transporters - Part 3-1: Performance test method for total run time of e-scooters with consideration to environmental conditions of actual use
E-Transporters - Part 3-2: Performance test methods for mobility of cargo e-Transporters
Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors
Flexible organic light emitting diode (OLED) panels for general lighting - Performance requirements
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Semiconductor devices - Generic semiconductor qualification guidelines - Part 3: Guidelines for reliability qualification plans for power semiconductor module
Semiconductor devices - Guidelines for reliability qualification plans - Part 4: Early failure assessment
Test methods for electric cables with rated voltages up to and including 450/750 V
Specification for WB series glass beads with 50 impedance for RF connectors
Portable multimedia equipment - Determination of battery duration - Part 1: Powered loudspeaker equipment
Portable multimedia equipment - Determination of battery duration - Part 2: Headphones and earphones with active noise-cancelling functions
Portable multimedia equipment - Determination of battery duration - Part 3: Wearable powered loudspeaker equipment
Sensing devices for non-intrusive load monitoring (NILM) systems
Nuclear power plants - Electrical power systems - Coordination and interaction with electric grid
Page 249 of 313