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IEC/TS 63202-4 Ed. 1.0 en:2022

Photovoltaic cells - Part 4: Measurement of light and elevated temperature induced degradation of crystalline silicon photovoltaic cells
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IEC/TS 63202-4 Ed. 1.0 en:2022

Photovoltaic cells - Part 4: Measurement of light and elevated temperature induced degradation of crystalline silicon photovoltaic cells

PUBLISH DATE 2022
IEC/TS 63202-4 Ed. 1.0 en:2022
Photovoltaic cells - Part 4: Measurement of light and elevated temperature induced degradation of crystalline silicon photovoltaic cells
IEC TS 63202-4:2022 describes procedures for measuring the light and elevated temperature induced degradation (LETID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The requirements for measuring initial light induced degradation (LID) of crystalline silicon PV cells are covered by IEC 63202-1, where LID degradation risk of PV cells under moderate temperature and initial durations within termination criteria of 20 kWh·m-2 are evaluated. The procedures described in this document are to evaluate the degradation behaviour of PV cells under elevated temperature and longer duration of light irradiation. The procedures described in this document can be used to detect the LETID risks of PV cells [2],[3] and to judge the effectiveness of LETID mitigation measures, e.g. quick test for production monitoring, thus helping improve the energy yield of PV modules.
SDO IEC: International Electrotechnical Commission
Document Number IEC/TS 63202
Publication Date June 1, 2022
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 82
Publish Date Document Id Type View
June 5, 2024 Revision
June 1, 2022 IEC/TS 63202-4 Ed. 1.0 en:2022 Revision