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BSI BS EN 61967-1:2002

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- General conditions and definitions
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BSI BS EN 61967-1:2002

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- General conditions and definitions

PUBLISH DATE 2002
BSI BS EN 61967-1:2002
Provides general information and definitions on measurement of conducted and radiated electromagnetic disturbances from integrated circuits. Also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. A test method comparison table is included to assist in selecting the appropriate measurement method(s). Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit.
SDO BSI: British Standards Institution
Document Number EN 61967-1
Publication Date July 2, 2002
Language en - English
Page Count
Revision Level
Supercedes
Committee EPL/47
Publish Date Document Id Type View
July 2, 2002 BS EN 61967-1:2002 Revision