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IEC 60747-18-1 Ed. 1.0 en:2019

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
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IEC 60747-18-1 Ed. 1.0 en:2019

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors

PUBLISH DATE 2019
PAGES 30
IEC 60747-18-1 Ed. 1.0 en:2019
Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.
SDO IEC: International Electrotechnical Commission
Document Number IEC 60747
Publication Date May 1, 2019
Language en - English
Page Count 30
Revision Level 1.0
Supercedes
Committee 47E
Publish Date Document Id Type View
May 1, 2019 Revision
May 1, 2019 IEC 60747-18-1 Ed. 1.0 en:2019 Revision