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IEC 62951-2 Ed. 1.0 b:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
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IEC 62951-2 Ed. 1.0 b:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices

PUBLISH DATE 2019
PAGES 26
IEC 62951-2 Ed. 1.0 b:2019
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.
SDO IEC: International Electrotechnical Commission
Document Number IEC 62951
Publication Date April 1, 2019
Language b - English & French
Page Count 26
Revision Level 1.0
Supercedes
Committee 47
Publish Date Document Id Type View
April 1, 2019 Revision
April 1, 2019 IEC 62951-2 Ed. 1.0 b:2019 Revision